The Layer Explorer is fully-automated and measures the silicone oil layer down to 50 nm through a glass or plastic surface.
1. 4 dimensional scan
The advanced X,Y, and Z autofocus ensures the accuracy of the measurement. Start and endpoint of the line scan are defined. Each spot is positioned with an accuracy of 100 nm. A lateral resolution of 5 µm is ensured. With the optional radial scan unit the entire inner wall of the syringe is rendered accessible.
2. Reflectometry
Reflectometry is a fast and reliable technology for the measurement of film thickness. The absolute result depends on the refractive index n of the materials. If the refractive index of the material that is forming a thin layer and a few other parameters are known, the film thickness can be calculated from the obtained spectrum.
3. Spectrum
Within milliseconds the Layer Explorer automatically measures the layer thickness spectrum from the inner wall of the glass.
4. Interpretation
The Layer Explorer software automatically calculates the actual thickness of the layer using a very accurate mathematical algorithm, working in a range from 50-5000 nm in the standard model.
5. Documentation
Location of the measurement spot, raw data and layer thickness are stored reliably in configurable reports. The results file generated by the system includes all measurement parameters, system configurations and raw data. The main parameters of interest are available in the standard reports, all compliant to 21 CFR Part 11 allowing you to document the actual status of your silicone layer in cGMP regulated environments.
