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The Layer Explorer (LE) is equipped with auto-focus, integrated reflectrometry, imaging, and illumination technology. Therefore, results regarding sprayed-on siliconization layers, down to 50 nm, can be quickly generated using high throughput technology.


Standard

Silicone layer thickness measurements of glass or plastic syringes from 50 - 4,000 nm on a spot size of Ø 50 µm with a min spot distance of 50 µm and max 200 spots / line

Auto-focus controlled positioning on axes X, Y and Z

Sample holder for Ø 6 - 22 mm

Storage of 500 x 250 µm silicone layer microscopic images

Provides data regarding syringe quality in just seconds

Provides high resolution images and plots every detail of the layer thickness distribution up to 7,200 data points

Thickness measurement calibration using traceable standards

Software with user hierarchy and data storage adherent to 21 CFR Part 11 standards and programmed according to GAMP IV

All measurement modes, formats and other measurement program information stored in method files

IQ, OQ and PQ documentation package

Global service and distribution

Reliable and reproducible results